JEOL: Launch of the New Benchtop Scanning Electron Microscope “JCM-7000Plus NeoScope™”

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Postmedia has not reviewed the content. by Business Wire JEOL: Launch of the New Benchtop Scanning Electron Microscope "JCM-7000Plus NeoScope™"Author of the article:JCM-7000Plus NeoScope™ Business WireTOKYO — JEOL Ltd. (President & CEO: Izumi Oi) has developed the benchtop scanning electron microscope (SEM) “JCM-7000Plus” and will begin sales on September 1, 2026.THIS CONTENT IS RESERVED FOR SUBSCRIBERS ONLYSubscribe now to read the latest news in your city and across Canada.Exclusive articles from Barbara Shecter, Joe O'Connor, Gabriel Friedman, and others.Daily content from Financial Times, the world's leading global business publication.Unlimited online access to read articles from Financial Post, National Post and 15 news sites across Canada with one account.National Post ePaper, an electronic replica of the print edition to view on any device, share and comment on.Daily puzzles, including the New York Times Crossword.SUBSCRIBE TO UNLOCK MORE ARTICLESSubscribe now to read the latest news in your city and across Canada.Exclusive articles from Barbara Shecter, Joe O'Connor, Gabriel Friedman and others.Daily content from Financial Times, the world's leading global business publication.Unlimited online access to read articles from Financial Post, National Post and 15 news sites across Canada with one account.National Post ePaper, an electronic replica of the print edition to view on any device, share and comment on.Daily puzzles, including the New York Times Crossword.REGISTER / SIGN IN TO UNLOCK MORE ARTICLESCreate an account or sign in to continue with your reading experience.Access articles from across Canada with one account.Share your thoughts and join the conversation in the comments.Enjoy additional articles per month.Get email updates from your favourite authors.THIS ARTICLE IS FREE TO READ REGISTER TO UNLOCK.Create an account or sign in to continue with your reading experience.Access articles from across Canada with one accountShare your thoughts and join the conversation in the commentsEnjoy additional articles per monthGet email updates from your favourite authorsSign In or Create an AccountBenchtop scanning electron microscopes are increasingly used in fields including electrical and electronics, automotive and machinery, steel and metals, chemical and pharmaceuticals. They are utilized not only in research and development but also in manufacturing-related applications, such as quality control and product inspection. In addition, they are adopted in educational settings at middle and high schools as well as universities. Given these diverse applications, there is growing demand for improved operational efficiency, simpler and more automated operation, and enhanced observation, analysis, and measurement performance.To meet these needs, we have expanded the landing voltage (accelerating voltage) to 20 kV. This has improved resolution to 6 nm, enabling measurements at higher magnification.Get the latest headlines, breaking news and columns.By signing up you consent to receive the above newsletter from Postmedia Network Inc.A welcome email is on its way. If you don't see it, please check your junk folder.The next issue of Top Stories will soon be in your inbox.We encountered an issue signing you up. Please try againOn the software side, the new JCM-7000Plus retains the simple, user-friendly GUI of the current JCM-7000, including Zeromag, which enables a seamless transition from optical imaging to SEM observation, and the Live Analysis function, which allows real-time elemental analysis during observation. It also adds the enhanced automation feature Neo Action.In addition to the three existing Live functions (Live Analysis, Live Map, and Live 3D), we have added two new features: Live Particle, which automatically measures particle size and count in real time while observing, and Live Report, which automatically acquires data and generates reports while moving the field of view, a feature available in high-end FE-SEMs. These features simplify routine tasks, making them more intuitive and efficient while significantly supporting users’ analytical workflows.1. Expanding landing voltage to 20 kV for improved resolution (secondary electron image: 6 nm, backscattered electron image: 8 nm)2. Improved backscattered electron detector for enhanced image quality3. New Live Particle function automatically measures particle size and count, simplifying workflow4. Live Report enables data acquisition and report creation while moving the field of view, improving work efficiency5. Simple and user-friendly GUI retained, with added automation functions for more intuitive and easier operationView source version on businesswire.com: This advertisement has not loaded yet.Notice for the Postmedia NetworkThis website uses cookies to personalize your content (including ads), and allows us to analyze our traffic. Read more about cookies here. By continuing to use our site, you agree to our Terms of Use and Privacy Policy.